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Volume: 33 | Article ID: art00013
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A new PDAF correction method of CMOS image sensor with Nonacell and Super PD to improve image quality in binning mode
  DOI :  10.2352/ISSN.2470-1173.2021.9.IQSP-220  Published OnlineJanuary 2021
Abstract

This paper presents a new PDAF correction method to improve the binning mode image quality in the world’s first 0.8um 108 mega pixel CMOS Image Sensor with Samsung Nonacell and Super PD technology. PDAF pixels had been fixed by bad-pixel-correction (BPC), referring to the adjacent non-PDAF pixels in the conventional correction method. We demonstrated a new method, named Dilution mode which output their own seed value within the 3x3 same color-channel pixels to video images and deliver AF information through the separate embedded data. As a result, the PDAF artifact, such as a false color, broken line and dot artifact in a high frequency pattern and overall image detail have dramatically improved in dilution mode.

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Yeongheup Jang, Hyungwook Kim, Kundong Kim, Sungsu Kim, Sungyong Lee, Joonseo Yim, "A new PDAF correction method of CMOS image sensor with Nonacell and Super PD to improve image quality in binning modein Proc. IS&T Int’l. Symp. on Electronic Imaging: Image Quality and System Performance XVIII,  2021,  pp 220-1 - 220-5,  https://doi.org/10.2352/ISSN.2470-1173.2021.9.IQSP-220

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