Back to articles
Articles
Volume: 31 | Article ID: art00008
Image
Noise suppression effect of folding-integration applied to a column-parallel 3-stage pipeline ADC in a 2.1 μm 33-megapixel CMOS image sensor
Kohei Tomioka
Toshio Yasue
Ryohei Funatsu
Tomoki Matsubara
Tomohiko Kosugi
Sung-Wook Jun
Takashi Watanabe
Masanori Nagase
Toshiaki Kitajima
Satoshi Aoyama
Shoji Kawahito
  DOI :  10.2352/ISSN.2470-1173.2019.9.IMSE-367  Published Online :  January 2019
Abstract

This study investigated the noise suppression effect of multiple sampling applied to a 3-stage pipeline analog-to-digital converter (ADC) in a 33-megapixel, 120-fps 1.25-in CMOS image sensor. The 3-stage pipeline ADC is composed of folding-integration (FI), cyclic, and successive approximation register ADCs, and the multiple sampling for noise suppression is implemented in the FI ADC. The sampling number M is limited by the conversion interval of the FI ADC and the maximum sampling number is M=6 at the 120-fps operation. To investigate the noise suppression effect of 120-fps operation, we measured the random noise of the pixel readout circuit to the sampling number M and compared with theoretical calculations. As a result, we confirmed that the measurement result corresponds reasonably well with the calculated result and the sampling number M = 6 is effective for noise suppression. Furthermore, the calculations revealed that the influence of 1/f noise of the source follower is dominant on the noise performance.

Journal Title : Electronic Imaging
Publisher Name : Society for Imaging Science and Technology
Publisher Location : 7003 Kilworth Lane, Springfield, VA 22151 USA
Subject Areas :
Views 26
Downloads 8
 DOI 10.2352/ISSN.2470-1173.2019.9.IMSE-367
 articleview.views 26
 articleview.downloads 8
  Cite this article 

Kohei Tomioka, Toshio Yasue, Ryohei Funatsu, Tomoki Matsubara, Tomohiko Kosugi, Sung-Wook Jun, Takashi Watanabe, Masanori Nagase, Toshiaki Kitajima, Satoshi Aoyama, Shoji Kawahito, "Noise suppression effect of folding-integration applied to a column-parallel 3-stage pipeline ADC in a 2.1 μm 33-megapixel CMOS image sensor"  in Proc. IS&T Int’l. Symp. on Electronic Imaging: Image Sensors and Imaging Systems,  2019,  pp 367-1 - 367-7,  https://doi.org/10.2352/ISSN.2470-1173.2019.9.IMSE-367

 Copy citation
  Copyright statement 
Copyright © Society for Imaging Science and Technology 2019
72010604
Electronic Imaging
2470-1173
Society for Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151 USA
10.2352/ISSN.2470-1173.2019.9.IMSE-367
2470-1173(20190113)2019:9L.3671;1-
ei_24701173_v2019n9_input/s8.xml
/ist/ei/2019/00002019/00000009/art00008
Articles
Noise suppression effect of folding-integration applied to a column-parallel 3-stage pipeline ADC in a 2.1 μm 33-megapixel CMOS image sensor
TomiokaKohei
YasueToshio
FunatsuRyohei
MatsubaraTomoki
KosugiTomohiko
JunSung-Wook
WatanabeTakashi
NagaseMasanori
KitajimaToshiaki
AoyamaSatoshi
KawahitoShoji
13012019
2019
9
367-1
367-7
2019
This study investigated the noise suppression effect of multiple sampling applied to a 3-stage pipeline analog-to-digital converter (ADC) in a 33-megapixel, 120-fps 1.25-in CMOS image sensor. The 3-stage pipeline ADC is composed of folding-integration (FI), cyclic, and successive approximation register ADCs, and the multiple sampling for noise suppression is implemented in the FI ADC. The sampling number M is limited by the conversion interval of the FI ADC and the maximum sampling number is M=6 at the 120-fps operation. To investigate the noise suppression effect of 120-fps operation, we measured the random noise of the pixel readout circuit to the sampling number M and compared with theoretical calculations. As a result, we confirmed that the measurement result corresponds reasonably well with the calculated result and the sampling number M = 6 is effective for noise suppression. Furthermore, the calculations revealed that the influence of 1/f noise of the source follower is dominant on the noise performance.
8K UHDTVlow noisecorrelated multiple samplingCMOS image sensor