Back to articles
Volume: 28 | Article ID: art00004
BRDF Interpolation using Anisotropic Stencils
  DOI :  10.2352/ISSN.2470-1173.2016.9.MMRMA-356  Published OnlineFebruary 2016

Fast and reliable measurement of material appearance is crucial for many applications ranging from virtual prototyping to visual quality control. The most common appearance representation is BRDF capturing illumination- and viewing-dependent reflectance. One of the approaches to rapid BRDF measurement captures its subspace, using so called slices, by continuous movements of a light and camera in azimuthal directions, while their elevations remain fixed. This records set of slices in the BRDF space while remaining data are unknown. We present a novel approach to BRDF reconstruction based on a concept of anisotropic stencils interpolating values along predicted locations of anisotropic highlights. Our method marks an improvement over the original linear interpolation method, and thus we ascertain it to be a promising variant of interpolation from such sparse yet very effective measurements.

Subject Areas :
Views 29
Downloads 0
 articleview.views 29
 articleview.downloads 0
  Cite this article 

Radomír Vávra, Jiří Filip, "BRDF Interpolation using Anisotropic Stencilsin Proc. IS&T Int’l. Symp. on Electronic Imaging: Measuring, Modeling, and Reproducing Material Appearance,  2016,

 Copy citation
  Copyright statement 
Copyright © Society for Imaging Science and Technology 2016
Electronic Imaging
Society for Imaging Science and Technology