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Volume: 28 | Article ID: art00016
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ADC Techniques for Optimized Conversion Time in CMOS Image Sensors
C Pastorelli
P Mellot
S Mir
C Tubert
  DOI :  10.2352/ISSN.2470-1173.2016.12.IMSE-268  Published Online :  February 2016
Abstract

For several decades, many CMOS Image Sensors (CIS) with a small pixel size have used single slope column parallel ADCs (SS-ADC). It is well known that the main drawback of this ADC is the conversion speed. This paper presents several ADC architectures which improve the speed of a SS-ADC. Different architectures are compared in terms of ADC resolution, power consumption, noise and conversion time.

Journal Title : Electronic Imaging
Publisher Name : Society for Imaging Science and Technology
Publisher Location : 7003 Kilworth Lane, Springfield, VA 22151 USA
Subject Areas :
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 DOI 10.2352/ISSN.2470-1173.2016.12.IMSE-268
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  Cite this article 

C Pastorelli, P Mellot, S Mir, C Tubert, "ADC Techniques for Optimized Conversion Time in CMOS Image Sensors"  in Proc. IS&T Int’l. Symp. on Electronic Imaging: Image Sensors and Imaging Systems,  2016,  https://doi.org/10.2352/ISSN.2470-1173.2016.12.IMSE-268

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  Copyright statement 
Copyright © Society for Imaging Science and Technology 2016
72010604
Electronic Imaging
2470-1173
Society for Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151 USA
10.2352/ISSN.2470-1173.2016.12.IMSE-268
2470-1173(20160214)2016:12L.1;1-
ei_24701173_v2016n12_input/s8.xml
/ist/ei/2016/00002016/00000012/art00016
Articles
ADC Techniques for Optimized Conversion Time in CMOS Image Sensors
PastorelliC
MellotP
MirS
TubertC
14022016
2016
12
1
6
2016
For several decades, many CMOS Image Sensors (CIS) with a small pixel size have used single slope column parallel ADCs (SS-ADC). It is well known that the main drawback of this ADC is the conversion speed. This paper presents several ADC architectures which improve the speed of a SS-ADC. Different architectures are compared in terms of ADC resolution, power consumption, noise and conversion time.
CMOS image sensorPiece-wise-linear rampPhoton shot noiseCalibration