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Volume: 2 | Article ID: art00008
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Device Characterization Using Spline Smoothing and Sequential Linear Interpolation
  DOI :  10.2352/CIC.1994.2.1.art00008  Published OnlineJanuary 1994
Abstract

Color correction of images for a non-linear device uses its characterization function, often evaluated by rectilinear interpolation of a table of measurements. Sequential linear interpolation (SLI) instead allows more freely distributed grid points, but usually requires remeasure-ment to place them optimally. We smooth the measured data with a tensor-product spline before using a fast SLI look-up table: noise is reduced, and the spline curvature reveals choice SLI grid locations without remeasurement.

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Ian E. Bell, William Cowan, "Device Characterization Using Spline Smoothing and Sequential Linear Interpolationin Proc. IS&T 2nd Color and Imaging Conf.,  1994,  pp 29 - 32,  https://doi.org/10.2352/CIC.1994.2.1.art00008

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Copyright © Society for Imaging Science and Technology 1994
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