Back to articles
Volume: 11 | Article ID: art00030
Predicting Cone Quantum Catches under Illuminant Change
  DOI :  10.2352/CIC.2003.11.1.art00030  Published OnlineJanuary 2003

Given LMS cone quantum catches from a surface under a first illuminant what is the best method of predicting what the corresponding quantum catches will be for the same surface under a second illuminant given only the quantum catches of a white surface under both illuminants? The von Kries rule is one well known method. In this paper, two new prediction methods along with a variation on an existing third method are introduced and then compared experimentally. In contrast to the von Kries rule which is equivalent to a diagonal transformation, all three methods estimate a full 3-by-3 linear transformation mapping LMS values between illuminants. All the new methods perform better than the von Kries rule.

Subject Areas :
Views 4
Downloads 0
 articleview.views 4
 articleview.downloads 0
  Cite this article 

Graham Finlayson, Brian Funt, Hao Jiang, "Predicting Cone Quantum Catches under Illuminant Changein Proc. IS&T 11th Color and Imaging Conf.,  2003,  pp 170 - 174,

 Copy citation
  Copyright statement 
Copyright © Society for Imaging Science and Technology 2003
Color and Imaging Conference
color imaging conf
Society of Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151, USA