This paper presents a new PDAF correction method to improve the binning mode image quality in the world’s first 0.8um 108 mega pixel CMOS Image Sensor with Samsung Nonacell and Super PD technology. PDAF pixels had been fixed by bad-pixel-correction (BPC), referring to the adjacent non-PDAF pixels in the conventional correction method. We demonstrated a new method, named Dilution mode which output their own seed value within the 3x3 same color-channel pixels to video images and deliver AF information through the separate embedded data. As a result, the PDAF artifact, such as a false color, broken line and dot artifact in a high frequency pattern and overall image detail have dramatically improved in dilution mode.
Low optical-crosstalk color pixel scheme with wave-guiding structures is demonstrated in a high resolution CMOS image sensor with a 0.8um pixel pitch. The high and low refractive index configuration provides a good confinement of light waves in different color channels in a quad Bayer color filter array. The measurement result of this back-side illuminated (BSI) device exhibits a significant lower color crosstalk with enhanced SNR performance, while the better angular response and higher angular selectivity of phase detection pixels also show the suitability to a new generation of small pixels for CMOS image sensors.