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Volume: 18 | Article ID: art00094_2
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Electro-Photographic Monochrome Cartridge Yield Testing: Problems, Approaches, Suggestions
Paul L. Jeran
David R. Spencer
  DOI :  10.2352/ISSN.2169-4451.2002.18.1.art00094_2  Published Online :  January 2002
Journal Title : NIP & Digital Fabrication Conference
Publisher Name : Society of Imaging Science and Technology
Publisher Location : 7003 Kilworth Lane, Springfield, VA 22151, USA
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 DOI 10.2352/ISSN.2169-4451.2002.18.1.art00094_2
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Paul L. Jeran, David R. Spencer, "Electro-Photographic Monochrome Cartridge Yield Testing: Problems, Approaches, Suggestions"  in Proc. IS&T Int'l Conf. on Digital Printing Technologies (NIP18),  2002,  pp 794 - 797,  https://doi.org/10.2352/ISSN.2169-4451.2002.18.1.art00094_2

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Copyright © Society for Imaging Science and Technology 2002
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NIP & Digital Fabrication Conference
nip digi fabric conf
2169-4451
Society of Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151, USA
2169-4451(20020101)2002:2L.794;1-
nip_v2002n2/splitsection94.xml
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Articles
Electro-Photographic Monochrome Cartridge Yield Testing: Problems, Approaches, Suggestions
JeranPaul L.
SpencerDavid R.
01012002
2002
2
794
797
2002