Back to articles
Articles
Volume: 18 | Article ID: art00077_2
Image
Numerical Simulation of Charging Characteristics under the Influence of Photoreceptor Defects
  DOI :  10.2352/ISSN.2169-4451.2002.18.1.art00077_2  Published OnlineJanuary 2002
Abstract

Two-dimensional numerical study was carried out on the problem in charging known as the pin-hole leak phenomenon caused by photoreceptor defects in the roller charging system under constant current control with the DC voltage superposed on the AC voltage applied using the finite difference method in the generalized coordinate system. In this simulation, the pin-hole leak phenomenon was numerically reproduced by constructing a roller charging system model with photoreceptor defects and its mechanism was clarified. Further, the effects of the BCR (Biased Charging Roller) parameters to reduce the size of the image defect were quantitatively investigated. Consequently, it was suggested that larger BCR resistivity and higher AC frequency were both effective.

Subject Areas :
Views 2
Downloads 1
 articleview.views 2
 articleview.downloads 1
  Cite this article 

Satoshi Hasebe, Nobuyuki Nakayama, "Numerical Simulation of Charging Characteristics under the Influence of Photoreceptor Defectsin Proc. IS&T Int'l Conf. on Digital Printing Technologies (NIP18),  2002,  pp 737 - 737,  https://doi.org/10.2352/ISSN.2169-4451.2002.18.1.art00077_2

 Copy citation
  Copyright statement 
Copyright © Society for Imaging Science and Technology 2002
72010410
NIP & Digital Fabrication Conference
nip digi fabric conf
2169-4451
Society of Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151, USA