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Volume: 17 | Article ID: art00075_2
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Surface Voltage Decay Model of Phthalocyanine Binder Type Photorecepter (II)
Yasushi Hoshino
  DOI :  10.2352/ISSN.2169-4451.2001.17.1.art00075_2  Published Online :  January 2001
Abstract

Recently, demands of high resolution printing by electrophotography are increased. To realize high resolution, high gamma characteristics of surface voltage decay versus irradiation energy are paid attention to. High gamma characteristics can make the electrostatic image formed on the photoreceptor sharp compared with the light image irradiated on the photoreceptor. The mechanism of high gamma characteristics is considered due to structural trap. On the base of the structural trap model, surface voltage decay is calculated by changing the characteristic length of the structural trap. It is obtained, when the characteristic length increase, the gamma value of surface voltage decay increases. The gamma values obtained by experiments are compared with the calculated results and the characteristic length is estimated.

Journal Title : NIP & Digital Fabrication Conference
Publisher Name : Society of Imaging Science and Technology
Publisher Location : 7003 Kilworth Lane, Springfield, VA 22151, USA
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 DOI 10.2352/ISSN.2169-4451.2001.17.1.art00075_2
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Yasushi Hoshino, "Surface Voltage Decay Model of Phthalocyanine Binder Type Photorecepter (II)"  in Proc. IS&T Int'l Conf. on Digital Printing Technologies (NIP17),  2001,  pp 772 - 775,  https://doi.org/10.2352/ISSN.2169-4451.2001.17.1.art00075_2

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Copyright © Society for Imaging Science and Technology 2001
72010410
NIP & Digital Fabrication Conference
nip digi fabric conf
2169-4451
Society of Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151, USA
2169-4451(20010101)2001:2L.772;1-
nip_v2001n2/splitsection75.xml
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Articles
Surface Voltage Decay Model of Phthalocyanine Binder Type Photorecepter (II)
HoshinoYasushi
01012001
2001
2
772
775
2001
Recently, demands of high resolution printing by electrophotography are increased. To realize high resolution, high gamma characteristics of surface voltage decay versus irradiation energy are paid attention to. High gamma characteristics can make the electrostatic image formed on the photoreceptor sharp compared with the light image irradiated on the photoreceptor. The mechanism of high gamma characteristics is considered due to structural trap. On the base of the structural trap model, surface voltage decay is calculated by changing the characteristic length of the structural trap. It is obtained, when the characteristic length increase, the gamma value of surface voltage decay increases. The gamma values obtained by experiments are compared with the calculated results and the characteristic length is estimated.