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Volume: 17 | Article ID: art00045_2
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Numerical Simulation of Charging Characteristics under the Influence of Photoreceptor Defects
Satoshi Hasebe
Nobuyuki Nakayama
  DOI :  10.2352/ISSN.2169-4451.2001.17.1.art00045_2  Published Online :  January 2001
Abstract

Two-dimensional numerical study was carried out on the problem in charging known as the pin-hole leak phenomenon caused by photoreceptor defects in the roller charging system under constant current control with the DC voltage superposed on the AC voltage applied using the finite difference method in the generalized coordinate system. In this simulation, the pin-hole leak phenomenon was numerically reproduced by constructing a roller charging system model with photoreceptor defects and its mechanism was clarified. Further, the effects of the BCR (Biased Charging Roller) parameters to reduce the size of the image defect were quantitatively investigated. Consequently, it was suggested that larger BCR resistivity and higher AC frequency were both effective.

Journal Title : NIP & Digital Fabrication Conference
Publisher Name : Society of Imaging Science and Technology
Publisher Location : 7003 Kilworth Lane, Springfield, VA 22151, USA
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 DOI 10.2352/ISSN.2169-4451.2001.17.1.art00045_2
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Satoshi Hasebe, Nobuyuki Nakayama, "Numerical Simulation of Charging Characteristics under the Influence of Photoreceptor Defects"  in Proc. IS&T Int'l Conf. on Digital Printing Technologies (NIP17),  2001,  pp 639 - 642,  https://doi.org/10.2352/ISSN.2169-4451.2001.17.1.art00045_2

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Copyright © Society for Imaging Science and Technology 2001
72010410
NIP & Digital Fabrication Conference
nip digi fabric conf
2169-4451
Society of Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151, USA
2169-4451(20010101)2001:2L.639;1-
nip_v2001n2/splitsection45.xml
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Articles
Numerical Simulation of Charging Characteristics under the Influence of Photoreceptor Defects
HasebeSatoshi
NakayamaNobuyuki
01012001
2001
2
639
642
2001
Two-dimensional numerical study was carried out on the problem in charging known as the pin-hole leak phenomenon caused by photoreceptor defects in the roller charging system under constant current control with the DC voltage superposed on the AC voltage applied using the finite difference method in the generalized coordinate system. In this simulation, the pin-hole leak phenomenon was numerically reproduced by constructing a roller charging system model with photoreceptor defects and its mechanism was clarified. Further, the effects of the BCR (Biased Charging Roller) parameters to reduce the size of the image defect were quantitatively investigated. Consequently, it was suggested that larger BCR resistivity and higher AC frequency were both effective.