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Volume: 16 | Article ID: art00019_2
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Charge Injection at the Metal/Organic Interface
Yulong Shen
Matthias Klein
Daniel Jacobs
George Malliaras
  DOI :  10.2352/ISSN.2169-4451.2000.16.1.art00019_2  Published Online :  January 2000
Abstract

Measurements of charge injection from Indium Tin Oxide (ITO) to the organic semiconductor tetraphenyl diamine doped polycarbonate (PC:TPD) were carried out. The current injected at the contact was measured as a function of the hole mobility in the organic semiconductor, which was varied from 10-6 to 10-3 cm2/V·sec by adjusting the relative TPD to PC concentration. These experiments reveal that the current injected at the contact is proportional to the hole mobility in the bulk. As a result, the ITO/PC:TPD contact is found to limit current flow in all samples, regardless of the hole mobility in PC:TPD.

Journal Title : NIP & Digital Fabrication Conference
Publisher Name : Society of Imaging Science and Technology
Publisher Location : 7003 Kilworth Lane, Springfield, VA 22151, USA
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 DOI 10.2352/ISSN.2169-4451.2000.16.1.art00019_2
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  Cite this article 

Yulong Shen, Matthias Klein, Daniel Jacobs, George Malliaras, "Charge Injection at the Metal/Organic Interface"  in Proc. IS&T Int'l Conf. on Digital Printing Technologies (NIP16),  2000,  pp 488 - 488,  https://doi.org/10.2352/ISSN.2169-4451.2000.16.1.art00019_2

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Copyright © Society for Imaging Science and Technology 2000
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NIP & Digital Fabrication Conference
nip digi fabric conf
2169-4451
Society of Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151, USA
2169-4451(20000101)2000:2L.488;1-
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Articles
Charge Injection at the Metal/Organic Interface
ShenYulong
KleinMatthias
JacobsDaniel
MalliarasGeorge
01012000
2000
2
488
488
2000
Measurements of charge injection from Indium Tin Oxide (ITO) to the organic semiconductor tetraphenyl diamine doped polycarbonate (PC:TPD) were carried out. The current injected at the contact was measured as a function of the hole mobility in the organic semiconductor, which was varied from 10-6 to 10-3 cm2/V·sec by adjusting the relative TPD to PC concentration. These experiments reveal that the current injected at the contact is proportional to the hole mobility in the bulk. As a result, the ITO/PC:TPD contact is found to limit current flow in all samples, regardless of the hole mobility in PC:TPD.