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Volume: 16 | Article ID: art00019_2
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Charge Injection at the Metal/Organic Interface
  DOI :  10.2352/ISSN.2169-4451.2000.16.1.art00019_2  Published OnlineJanuary 2000
Abstract

Measurements of charge injection from Indium Tin Oxide (ITO) to the organic semiconductor tetraphenyl diamine doped polycarbonate (PC:TPD) were carried out. The current injected at the contact was measured as a function of the hole mobility in the organic semiconductor, which was varied from 10-6 to 10-3 cm2/V·sec by adjusting the relative TPD to PC concentration. These experiments reveal that the current injected at the contact is proportional to the hole mobility in the bulk. As a result, the ITO/PC:TPD contact is found to limit current flow in all samples, regardless of the hole mobility in PC:TPD.

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Yulong Shen, Matthias Klein, Daniel Jacobs, George Malliaras, "Charge Injection at the Metal/Organic Interfacein Proc. IS&T Int'l Conf. on Digital Printing Technologies (NIP16),  2000,  pp 488 - 488,  https://doi.org/10.2352/ISSN.2169-4451.2000.16.1.art00019_2

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