Back to articles
Articles
Volume: 15 | Article ID: art00085_2
Image
Analysis of Traps in OPC from the Dependence of Corona Charging Curve on Thickness of Photo Generation Layer
Chun-Wei Lin
Yasushi Hoshino
Shigeru Kitakubo
  DOI :  10.2352/ISSN.2169-4451.1999.15.1.art00085_2  Published Online :  January 1999
Abstract

Corona charging characteristics of photoreceptor is influenced by pre-exposure. The information of traps is obtained from the change of the charging characteristics by pre-exposure. In this report, the information of traps is analyzed by measuring on OPC (organic photo conductor) with three different thickness of photo generation layer. It is also reported the computer calculation method of the absorption current in OPC from the values of sampled surface voltage.

Journal Title : NIP & Digital Fabrication Conference
Publisher Name : Society of Imaging Science and Technology
Publisher Location : 7003 Kilworth Lane, Springfield, VA 22151, USA
Subject Areas :
Views 5
Downloads 0
 DOI 10.2352/ISSN.2169-4451.1999.15.1.art00085_2
 articleview.views 5
 articleview.downloads 0
  Cite this article 

Chun-Wei Lin, Yasushi Hoshino, Shigeru Kitakubo, "Analysis of Traps in OPC from the Dependence of Corona Charging Curve on Thickness of Photo Generation Layer"  in Proc. IS&T Int'l Conf. on Digital Printing Technologies (NIP15),  1999,  pp 707 - 709,  https://doi.org/10.2352/ISSN.2169-4451.1999.15.1.art00085_2

 Copy citation
  Copyright statement 
Copyright © Society for Imaging Science and Technology 1999
72010410
NIP & Digital Fabrication Conference
nip digi fabric conf
2169-4451
Society of Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151, USA
2169-4451(19990101)1999:2L.707;1-
nip_v1999n2/splitsection85.xml
/ist/nipdf/1999/00001999/00000002/art00085
Articles
Analysis of Traps in OPC from the Dependence of Corona Charging Curve on Thickness of Photo Generation Layer
LinChun-Wei
HoshinoYasushi
KitakuboShigeru
01011999
1999
2
707
709
1999
Corona charging characteristics of photoreceptor is influenced by pre-exposure. The information of traps is obtained from the change of the charging characteristics by pre-exposure. In this report, the information of traps is analyzed by measuring on OPC (organic photo conductor) with three different thickness of photo generation layer. It is also reported the computer calculation method of the absorption current in OPC from the values of sampled surface voltage.