Back to articles
Articles
Volume: 15 | Article ID: art00085_2
Image
Analysis of Traps in OPC from the Dependence of Corona Charging Curve on Thickness of Photo Generation Layer
  DOI :  10.2352/ISSN.2169-4451.1999.15.1.art00085_2  Published OnlineJanuary 1999
Abstract

Corona charging characteristics of photoreceptor is influenced by pre-exposure. The information of traps is obtained from the change of the charging characteristics by pre-exposure. In this report, the information of traps is analyzed by measuring on OPC (organic photo conductor) with three different thickness of photo generation layer. It is also reported the computer calculation method of the absorption current in OPC from the values of sampled surface voltage.

Subject Areas :
Views 1
Downloads 0
 articleview.views 1
 articleview.downloads 0
  Cite this article 

Chun-Wei Lin, Yasushi Hoshino, Shigeru Kitakubo, "Analysis of Traps in OPC from the Dependence of Corona Charging Curve on Thickness of Photo Generation Layerin Proc. IS&T Int'l Conf. on Digital Printing Technologies (NIP15),  1999,  pp 707 - 709,  https://doi.org/10.2352/ISSN.2169-4451.1999.15.1.art00085_2

 Copy citation
  Copyright statement 
Copyright © Society for Imaging Science and Technology 1999
72010410
NIP & Digital Fabrication Conference
nip digi fabric conf
2169-4451
Society of Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151, USA