Gonioradiometry plays a fundamental role in understanding the scattering properties of materials. As light interacts with surfaces, its scattering behaviour varies across different incident angles, wavelengths, and surface characteristics. Gonioradiometric measurements offer a systematic approach to quantify these intricate scattering patterns, by means of the Bidirectional Scattering Distribution function. In this paper, a new approach is presented to quantify this Bidirectional Scattering Distribution Function, for which an existing measurement instrument has been enhanced by incorporation of a hyperspectral imaging device. The hyperspectral imaging system enables detailed spectral reflectance data collection for each pixel, paving the way for measuring samples where the reflectance properties vary along the surface. Challenges such as zooming and dynamic range constraints are addressed, with the paper detailing the design and evaluation of the system. The hyperspectral gonioradiometer offers promising avenues for future research and applications in visual appearance metrology and material characterisation.