Back to articles
Regular Article
Volume: 56 | Article ID: art00003
Investigations of Charge Migration and Charge Trapping in Fatigued Organic Photoconductors
  DOI :  10.2352/J.ImagingSci.Technol.  Published OnlineNovember 2012

Abstract This article presents the experimental photodischarge kinetics of electrostatically fatigued dual-layer organic photoconductors characterized by an electrophotographic incremental charging technique that reveals the differences in the photoconductor charging profiles. During normal operation, 15% of the holes that migrate to the surface after photodischarge are not neutralized by the negative surface ions. The accumulation of these lingering surface charges (charge transport material radical cations) manifests itself as defects in half-tone images, as either missing or reduced size dots or lines. In the presence of corona gases, these surface holes oxidize and reduce the energy barrier for hole injection from a positively charged surface, e.g., contact with a transfer roller. These injected holes accumulate near the charge generation layer and require twice the amount of negative charge to attain the same surface potential as that of a new organic photoconductor (OPC) drum. The damaged depth of this injection region extends to about 50 nm into the OPC surface and is easily removed by the printer’s abrasion mechanisms (e.g., cleaning blade, toner, paper).

Subject Areas :
Views 19
Downloads 0
 articleview.views 19
 articleview.downloads 0
  Cite this article 

Zbigniew Tokarski, Yong-Jin Ahn, Soo-Yong Jung, "Investigations of Charge Migration and Charge Trapping in Fatigued Organic Photoconductorsin Journal of Imaging Science and Technology,  2012,  pp 60501-1 - 60501-11,

 Copy citation
  Copyright statement 
Copyright © Society for Imaging Science and Technology 2012
  Login or subscribe to view the content