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Volume: 55 | Article ID: art00005
Spatio-Spectral Modeling and Compensation of Transversal Chromatic Aberrations in Multispectral Imaging
  DOI :  10.2352/J.ImagingSci.Technol.2011.55.6.060502  Published OnlineNovember 2011

In optical imaging systems, the wavelength-dependency of the refraction indices of lenses causes chromatic aberrations: electromagnetic radiation from an object point is dispersed in a rainbow-like manner on the sensor. These aberrations were so far only measured and modeled for up to three, often relatively wideband wavelength bands, such as R, G, and B. Moreover, no relation between the aberrations of these color channels was generally considered. The authors describe here the measurement of chromatic aberrations for multiple narrowband color channels in multispectral imaging. Existing models for transversal distortions are discussed and the wavelengthdependency of their parameters is analyzed. The models are extended with univariate wavelength-dependent polynomials, thus leading to bivariate models for both space and wavelengthdependency. The authors compare the models and confirm their validity qualitatively and quantitatively and simulate aberrations with state-of-the-art raytracing software. With their wavelength-dependent model, the distortions can be compensated even at wavelengths for which no measurements are available.

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Julie Klein, Johannes Brauers, Til Aach, "Spatio-Spectral Modeling and Compensation of Transversal Chromatic Aberrations in Multispectral Imagingin Journal of Imaging Science and Technology,  2011,  pp 60502-1 - 60502-14,

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