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Volume: 44 | Article ID: art00009
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Unveiling the Composition of Sulfur Sensitization Specks by their Interaction with TAI
  DOI :  10.2352/J.ImagingSci.Technol.2000.44.3.art00009  Published OnlineMay 2000
Abstract

A two-step process for the formation of sensitivity centers different from earlier described two-step processes was found for sulfur sensitized emulsions. After deposition of sulfur in the first step, it was found that the second step does not consist of rearrangement of sulfur over the surface, but of the supply of silver interstitial ions towards the deposited sulfur clusters. The two processes could be separated by adsorbing and desorbing TAI (4-hydroxy-1, 3,3a, 7-tetraazaindene) at/from the silver halide surface. When 1.5 mmol TAI/mol Ag is added before the sulfur reaction, the silver interstitials are immobilized but sulfur still can be deposited at the same level. By lowering the pH to 2.50 after this sulfur reaction, TAI is desorbed from the surface and the released interstitials then cause a restoration of the properties of a sulfur system without TAI. These effects could be demonstrated via diffuse reflectance spectroscopy (DRS), sensitometry and dielectric loss measurements. We could also confirm the isolation of silver sulfide clusters by TAI from other chemicals in the solution, by adsorption of TAI on the clusters.

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E. Charlier, M. Van Doorselaer, R. Gijbels, R. De Keyzer, I. Geuens, "Unveiling the Composition of Sulfur Sensitization Specks by their Interaction with TAIin Journal of Imaging Science and Technology,  2000,  pp 235 - 241,  https://doi.org/10.2352/J.ImagingSci.Technol.2000.44.3.art00009

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