The scope of this study was to correlate the topographic information provided by atomic force microscopy (AFM) with optical properties of the AgX tabular grain photographic emulsion samples collected with near-field optical microscopies. Images of spectrally sensitized AgBr tabular grains were performed, using both AFM and photon scanning tunneling microscopy (PSTM). PSTM images of spectrally sensitized AgBr microcrystals, recorded at various excitation wavelengths, showed an amplification of the apparent thickness of the grains when excited in the absorption range of the dye. This can be explained by the contribution of the fluorescence of the sensitizing dye to the measured signal in the PSTM. The increase of the PSTM response depended also on the dye coverage and on the stack of microcrystals. The visible absorption and fluorescence spectra of the spectrally sensitized emulsion obtained at room temperature at a macroscopic scale were in good agreement with the PSTM observations.
C. Pic, D. Martin, J. Guilment, F. De Fornel, J. P. Goudonnet, "Spectroscopic Study of a Spectrally Sensitized Tabular Grain AgBr Emulsion Using Both AFM and PSTM Techniques" in Journal of Imaging Science and Technology, 1998, pp 126 - 134, https://doi.org/10.2352/J.ImagingSci.Technol.1998.42.2.art00006