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Special Section: Physical Methods for the Characterization of Imaging Materials and Processes
Volume: 41 | Article ID: art00006
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Time-Resolved Dielectric Loss for Characterization of Photoconductive and Photocatalytic Materials
  DOI :  10.2352/J.ImagingSci.Technol.1997.41.2.art00006  Published OnlineMarch 1997
Abstract

The purpose of this tutorial review is to illustrate the use of time-resolved dielectric loss (TRDL) and analysis of TRDL data on photoconductive materials for electrophotographic applications, as well as on photocatalytic imaging processes. Systems studied in our laboratories include particulate CdS for Canongraphic imaging and CdS powder dispersed in a xylene solution of phenylhydrazine, as a model for a photorecptor with separated charge generation and charge transport function. A study on prototypical molecular charge generation media is also reviewed, as is recent work on the characterization of TiO2, a prototypical photocatalyst of demonstrated imaging utility.

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M. R. V. Sahyun, "Time-Resolved Dielectric Loss for Characterization of Photoconductive and Photocatalytic Materialsin Journal of Imaging Science and Technology,  1997,  pp 127 - 134,  https://doi.org/10.2352/J.ImagingSci.Technol.1997.41.2.art00006

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