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Special Section: Physical Methods for the Characterization of Imaging Materials and Processes
Volume: 41 | Article ID: art00005
Principles of Microwave Absorption Technique Applied to AgX Microcrystals
  DOI :  10.2352/J.ImagingSci.Technol.1997.41.2.art00005  Published OnlineMarch 1997

Microwave absorption (MWA) enables contactless measurements of electronic transport properties in solids. MWA is the only method for studying the lifetimes and mobilities of the photogenerated charge carriers that depend on the recombination process of photoelectrons. Therefore MWA is a powerful tool to understand the influence of phase structures of point defects like Y, Ir3+, Pb++, Cu++, etc., dislocations; and chemical and dye sensitization on the formation of latent image specks.

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Th. Müssig, "Principles of Microwave Absorption Technique Applied to AgX Microcrystalsin Journal of Imaging Science and Technology,  1997,  pp 118 - 227,

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Copyright © Society for Imaging Science and Technology 1997
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