Back to articles
Article
Volume: 35 | Article ID: IQSP-313
Image
Managing deviant data in spatial frequency response (SFR) measurement by outlier rejection
  DOI :  10.2352/EI.2023.35.8.IQSP-313  Published OnlineJanuary 2023
Abstract
Abstract

The edge-based Spatial Frequency Response (e-SFR) method was first developed for evaluating camera image resolution and image sharpness. The method was described in the first version of the ISO 12233 standard. Since then, the method has been applied in a wide range of applications, including medical, security, archiving, and document processing. However, with this broad application, several of the assumptions of the method are no longer closely followed. This has led to several improvements aimed at broadening its application, for example for lenses with spatial distortion. We can think of the evaluation of image quality parameters as an estimation problem, based on the gathered data, often from digital images. In this paper, we address the mitigation of measurement error that is introduced when the analysis is applied to low-exposure (and therefore, noisy) applications and those with small analysis regions. We consider the origins of both bias and variation in the resulting SFR measurement and present practical ways to reduce them. We describe the screening of outlier edge-location values as a method for improved edge detection. This, in turn, is related to a reduction in negative bias in the resulting SFR.

Subject Areas :
Views 35
Downloads 14
 articleview.views 35
 articleview.downloads 14
  Cite this article 

Peter Burns, Don Williams, "Managing deviant data in spatial frequency response (SFR) measurement by outlier rejectionin Electronic Imaging,  2023,  pp 313-1 - 313-4,  https://doi.org/10.2352/EI.2023.35.8.IQSP-313

 Copy citation
  Copyright statement 
Copyright This work is licensed under the Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. 2023
ei
Electronic Imaging
2470-1173
2470-1173
Society for Imaging Science and Technology
IS&T 7003 Kilworth Lane, Springfield, VA 22151 USA