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Volume: 31 | Article ID: art00009
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Correlated Multiple Sampling impact analysis on 1/fE noise for image sensors
  DOI :  10.2352/ISSN.2470-1173.2019.9.IMSE-368  Published OnlineJanuary 2019
Abstract

Correlated Multiple Sampling (CMS), which is an extension of Correlated Double Sampling (CDS), is a very popular noise reduction technique used in the readout chain of image sensors. It has been analyzed in the literature, showing that, with an increasingly number M of samples, the total noise tends to a limit value dominated by the pixel 1/f noise. Nevertheless, this approach fails to explain why, in some cases, the total noise measurement may reach a minimum before, against all odds, finally growing with M. This paper shows that an explanation can be found if the pixel noise Power Spectral Density (PSD) varies in 1/fE with a frequency exponent E > 1 instead of E=1.

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A Peizerat, G Renaud, "Correlated Multiple Sampling impact analysis on 1/fE noise for image sensorsin Proc. IS&T Int’l. Symp. on Electronic Imaging: Image Sensors and Imaging Systems,  2019,  pp 368-1 - 368-6,  https://doi.org/10.2352/ISSN.2470-1173.2019.9.IMSE-368

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