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Volume: 29 | Article ID: art00006
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The challenge of shot-noise limited speckle patterns statistical analysis
  DOI :  10.2352/ISSN.2470-1173.2017.11.IMSE-181  Published OnlineJanuary 2017
Abstract

We propose to analyze in details the performances of an ASIC dedicated to the real-time analysis of speckle patterns statistics. This IC calculates average statistical values over the whole pixel array, and outputs only these values instead of a whole image: such on-chip calculation achieves the high acquisition rates required to follow speckle patterns from thick living tissue, without additional noises usually associated with fast data transfer. We want to assess if our device can reach its shot-noise limit, which is the shot-noise limit on one pixel divided by the square root of the number of pixels.

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J.-M. Tualle, K. Barjean, E. Tinet, D. Ettori, "The challenge of shot-noise limited speckle patterns statistical analysisin Proc. IS&T Int’l. Symp. on Electronic Imaging: Image Sensors and Imaging Systems,  2017,  pp 33 - 38,  https://doi.org/10.2352/ISSN.2470-1173.2017.11.IMSE-181

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Copyright © Society for Imaging Science and Technology 2017
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Electronic Imaging
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