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Volume: 28 | Article ID: art00018
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Testing Spatial Patterns for Acquiring Shape and Subsurface Scattering Properties
  DOI :  10.2352/ISSN.2470-1173.2016.9.MMRMA-371  Published OnlineFebruary 2016
Abstract

Models of both the shape and material properties of physical objects are needed in many computer graphics applications. In many design applications, even if shape is not needed, it is desirable to start with the material properties of existing non-planar objects. We consider the design of a system to capture both shape and appearance of objects. We focus particularly on objects that exhibit significant subsurface scattering and inter-reflection effects. We present preliminary results from a system that uses coded light from a set of small, inexpensive projectors coupled with commodity digital cameras.

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Yitzchak David Lockerman, Samuel Brenner, Joseph Lanzone, Alexander Doronin, Holly Rushmeier, "Testing Spatial Patterns for Acquiring Shape and Subsurface Scattering Propertiesin Proc. IS&T Int’l. Symp. on Electronic Imaging: Measuring, Modeling, and Reproducing Material Appearance,  2016,  https://doi.org/10.2352/ISSN.2470-1173.2016.9.MMRMA-371

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Copyright © Society for Imaging Science and Technology 2016
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Electronic Imaging
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Society for Imaging Science and Technology