Back to articles
Articles
Volume: 28 | Article ID: art00012
Image
A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique
  DOI :  10.2352/ISSN.2470-1173.2016.12.IMSE-282  Published OnlineFebruary 2016
Abstract

This paper presents a noise analysis and noise measurements of n-type and p-type pixels with correlated multiple sampling (CMS) technique. The output noise power spectral density (PSD) of both pixel types with different CMS noise reduction factors have been simulated and calculated in the spectral domain. For validation, two groups of test pixel have been fabricated with a state-of-the-art n-type and p-type CMOS image sensor (CIS) technology. The calculated and the measured noise results with CMS show a good agreement. Measurement results also show that the n-type and p-type pixels reach a 1.1 e- and 0.88 h+ input- referred temporal noise respectively with a board-level 64 times digital CMS and ×6 analog gain.

Subject Areas :
Views 14
Downloads 4
 articleview.views 14
 articleview.downloads 4
  Cite this article 

Xiaoliang Ge, Bastien Mamdy, Albert Theuwissen, "A comparative noise analysis and measurement for n-type and p-type pixels with CMS techniquein Proc. IS&T Int’l. Symp. on Electronic Imaging: Image Sensors and Imaging Systems,  2016,  https://doi.org/10.2352/ISSN.2470-1173.2016.12.IMSE-282

 Copy citation
  Copyright statement 
Copyright © Society for Imaging Science and Technology 2016
72010604
Electronic Imaging
2470-1173
Society for Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151 USA