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Volume: 5 | Article ID: art00038
Device Characterization Using Variable Rectilinear Interpolation
  DOI :  10.2352/CIC.1997.5.1.art00038  Published OnlineJanuary 1997

We propose variable rectilinear interpolation (VRI) as an alternative method for device characterization. Based on a rectilinear structure, this algorithm constructs a mapping with non-uniform nodes placed to maximize informational entropy while meeting the pre-defined error tolerance threshold. In this paper we describe the VRI algorithm and structure; followed by an example in which we characterize the Minolta Color PageWorks™ color printer.

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C.T. Yeung, Bob Lin, "Device Characterization Using Variable Rectilinear Interpolationin Proc. IS&T 5th Color and Imaging Conf.,  1997,  pp 193 - 196,

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