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Volume: 12 | Article ID: art00036
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Improved output device characterisation test charts
Graeme W. Gill
  DOI :  10.2352/CIC.2004.12.1.art00036  Published Online :  January 2004
Abstract

Many test charts popularly used for color output characterisation purposes, are based on a regular orthogonal sampling of device space. Mathematically such a rectangular sampling is not the most efficient way of exploring a multidimensional space, so an alternative based on a simplex sampling of device space has potential for improving the efficiency of device profiling, requiring fewer test point for a given profile accuracy, or returning a higher profile accuracy for a given number of test points.

Journal Title : Color and Imaging Conference
Publisher Name : Society of Imaging Science and Technology
Publisher Location : 7003 Kilworth Lane, Springfield, VA 22151, USA
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 DOI 10.2352/CIC.2004.12.1.art00036
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Graeme W. Gill, "Improved output device characterisation test charts"  in Proc. IS&T 12th Color and Imaging Conf.,  2004,  pp 200 - 202,  https://doi.org/10.2352/CIC.2004.12.1.art00036

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Copyright © Society for Imaging Science and Technology 2004
72010350
Color and Imaging Conference
color imaging conf
2166-9635
Society of Imaging Science and Technology
7003 Kilworth Lane, Springfield, VA 22151, USA
2166-9635(20040101)2004:1L.200;1-
cic_v2004n1/splitsection36.xml
/ist/cic/2004/00002004/00000001/art00036
Articles
Improved output device characterisation test charts
GillGraeme W.
01012004
2004
1
200
202
2004
Many test charts popularly used for color output characterisation purposes, are based on a regular orthogonal sampling of device space. Mathematically such a rectangular sampling is not the most efficient way of exploring a multidimensional space, so an alternative based on a simplex sampling of device space has potential for improving the efficiency of device profiling, requiring fewer test point for a given profile accuracy, or returning a higher profile accuracy for a given number of test points.