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                <front>
                    <journal-meta>
                    <journal-id journal-id-type="publisher-id">ei</journal-id>
                    <journal-title>Electronic Imaging</journal-title>
                    <issn pub-type="ppub">2470-1173</issn><issn pub-type="epub">2470-1173</issn>
                    <publisher>
                        <publisher-name>Society for Imaging Science and Technology</publisher-name>
                        <publisher-loc>IS&amp;T 7003 Kilworth Lane, Springfield, VA 22151 USA</publisher-loc>
                    </publisher>
                    </journal-meta>
                    <article-meta>
                    <article-id pub-id-type="doi">10.2352/EI.2026.38.8.IQSP-251</article-id>
                    <article-id pub-id-type="publisher-id">IQSP-251</article-id>
                    <article-categories>
                        <subj-group>
                        <subject>Proceedings Paper</subject>
                        </subj-group>
                    </article-categories>
                    <title-group>
                        <article-title>End-to-End CIS Digital Twin Using Lens Geometry Spectral Ray Tracing and Pixel Modeling</article-title>
                    </title-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Shin</surname>
                            <given-names>Jeongyong </given-names>
                           </name> <xref ref-type="aff" rid="aff1author1"/></contrib><aff id="aff1author1">Samsung Electronics, Republic of Korea</aff></contrib-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Kang</surname>
                            <given-names>Seonghyeon </given-names>
                           </name> <xref ref-type="aff" rid="aff1author2"/></contrib><aff id="aff1author2">Samsung Electronics, Republic of Korea</aff></contrib-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Kim</surname>
                            <given-names>Sangmin </given-names>
                           </name> <xref ref-type="aff" rid="aff1author3"/></contrib><aff id="aff1author3">Samsung Electronics, Republic of Korea</aff></contrib-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Kim</surname>
                            <given-names>Jinhee </given-names>
                           </name> <xref ref-type="aff" rid="aff2author4"/></contrib><aff id="aff2author4">Ansys, Republic of Korea</aff></contrib-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Noygues</surname>
                            <given-names>Sebastien </given-names>
                           </name> <xref ref-type="aff" rid="aff2author5"/></contrib><aff id="aff2author5">Ansys, Republic of Korea</aff></contrib-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Son</surname>
                            <given-names>Jeongwoo </given-names>
                           </name> <xref ref-type="aff" rid="aff2author6"/></contrib><aff id="aff2author6">Ansys, Republic of Korea</aff></contrib-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Choi</surname>
                            <given-names>Hyuntaek </given-names>
                           </name> <xref ref-type="aff" rid="aff2author7"/></contrib><aff id="aff2author7">Ansys, Republic of Korea</aff></contrib-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Lee</surname>
                            <given-names>Jeongwook </given-names>
                           </name> <xref ref-type="aff" rid="aff1author8"/></contrib><aff id="aff1author8">Samsung Electronics, Republic of Korea</aff></contrib-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Kim</surname>
                            <given-names>Sung-Su </given-names>
                           </name> <xref ref-type="aff" rid="aff1author9"/></contrib><aff id="aff1author9">Samsung Electronics, Republic of Korea</aff></contrib-group><contrib-group content-type="all"><contrib contrib-type="author"><name>
                            <surname>Kim</surname>
                            <given-names>Yitae </given-names>
                           </name> <xref ref-type="aff" rid="aff1author10"/></contrib><aff id="aff1author10">Samsung Electronics, Republic of Korea</aff></contrib-group><abstract>
                    <title>Abstract</title>
                    <p>This paper presents the development of an end-to-end digital twin system for CMOS Image Sensors (CIS) by leveraging Ansys Zemax, Speos, and Lumerical. We extracted the geometric and material data of an actual smartphone camera lens using Zemax, and calculated the irradiance post-lens through Spectral-based ray tracing simulations in Speos. Subsequently, Lumerical was utilized to precisely model pixel-level Quantum Efficiency (QE) across various wavelengths and optical fields, culminating in the generation of simulation-based digital images. The reliability and accuracy of this model were validated in a Cornell box-based environment by comparing the consistency of ESF, chromatic aberration, distortion, and chromaticity (CIE 1931) between experimental captures and digital twin simulations.</p>
                    </abstract><pub-date>
                        <day>1</day>
                        <month>3</month>
                        <year>2026</year>
                        </pub-date><volume>38</volume>
                    <issue-acronym>IQSP</issue-acronym>
                    <issue-title>Image Quality and System Performance XXIII</issue-title>
                    <issue seq="251">8</issue>
                    <fpage>251-1</fpage>
                    <lpage>251-6</lpage>
                    <permissions>
                         <copyright-statement>©2026 Society for Imaging Science and Technology</copyright-statement>
                        <copyright-year>2026</copyright-year>
                    </permissions><kwd-group><kwd>CMOS Image Sensor</kwd><kwd>Digital Twin</kwd><kwd>Spectral Ray Tracing</kwd><kwd>Pixel Modeling</kwd><kwd>Lens Geometry</kwd></kwd-group></article-meta>
                </front>
                </article>