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<article article-type="research-article">
  <front>
    <journal-meta>
      <journal-id journal-id-type="aggregator">72010604</journal-id>
      <journal-title>Electronic Imaging</journal-title>
      <issn pub-type="ppub">2470-1173</issn><issn pub-type="epub"></issn>
      <publisher>
        <publisher-name>Society for Imaging Science and Technology</publisher-name>
        <publisher-loc>7003 Kilworth Lane, Springfield, VA 22151 USA</publisher-loc>
      </publisher>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="doi">10.2352/ISSN.2470-1173.2019.7.IRIACV-453</article-id>
      <article-id pub-id-type="sici">2470-1173(20190113)2019:7L.4531;1-</article-id>
      <article-id pub-id-type="publisher-id">ei_24701173_v2019n7_r1/s5.xml</article-id>
      <article-id pub-id-type="other">/ist/ei/2019/00002019/00000007/art00005</article-id>
      <article-categories>
        <subj-group>
          <subject>Articles</subject>
        </subj-group>
      </article-categories>
      <title-group>
        <article-title>Automated optical inspection for abnormal-shaped packages</article-title>
      </title-group>
      <contrib-group>
        <contrib>
          <name>
            <surname>Lin</surname>
            <given-names>Wei-Yu</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Hsu</surname>
            <given-names>Chen-Tao</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Chang</surname>
            <given-names>Chi-Chun</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Chuang</surname>
            <given-names>Jen-Hui</given-names>
          </name>
        </contrib>
      </contrib-group>
      <pub-date>
        <day>13</day>
        <month>01</month>
        <year>2019</year>
      </pub-date>
      <volume>2019</volume>
      <issue>7</issue>
      <fpage>453-1</fpage>
      <lpage>453-5</lpage>
      <permissions>
        <copyright-year>2019</copyright-year>
      </permissions>
      <abstract>
        <p>
          <italic>In this paper, we develop an automated optical inspection method to detect yarn packages’ defect. Although textile industry is regarded as traditional industry, many new technologies, e.g., computer vision detection algorithms, are applied to this industry I recent years. Yarn
 packages are the semi-finished good of textile industry. Various factors may cause abnormal-shaped packages. In this study, we develop three defect detection algorithms to extract abnormal-shape packages. These algorithms can help manufacturer to avoid the disadvantages of human inspection
 effectively and improve the productive quality.</italic>
        </p>
      </abstract>
      <kwd-group>
        <kwd>AOI</kwd>
        <kwd>textile</kwd>
        <kwd>curve fitting</kwd>
      </kwd-group>
    </article-meta>
  </front>
</article>
