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<article article-type="research-article">
  <front>
    <journal-meta>
      <journal-id journal-id-type="aggregator">72010604</journal-id>
      <journal-title>Electronic Imaging</journal-title>
      <issn pub-type="ppub">2470-1173</issn><issn pub-type="epub"></issn>
      <publisher>
        <publisher-name>Society for Imaging Science and Technology</publisher-name>
      </publisher>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="doi">10.2352/ISSN.2470-1173.2017.8.MAAP-280</article-id>
      <article-id pub-id-type="sici">2470-1173(20170129)2017:8L.101;1-</article-id>
      <article-id pub-id-type="publisher-id">s16.phd</article-id>
      <article-id pub-id-type="other">/ist/ei/2017/00002017/00000008/art00016</article-id>
      <article-categories>
        <subj-group>
          <subject>Articles</subject>
        </subj-group>
      </article-categories>
      <title-group>
        <article-title>Evaluating an image based multi-angle measurement setup using different reflection models</article-title>
      </title-group>
      <contrib-group>
        <contrib>
          <name>
            <surname>Sole</surname>
            <given-names>Aditya</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Farup</surname>
            <given-names>Ivar</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Nussbaum</surname>
            <given-names>Peter</given-names>
          </name>
        </contrib>
      </contrib-group>
      <pub-date>
        <day>29</day>
        <month>01</month>
        <year>2017</year>
      </pub-date>
      <volume>2017</volume>
      <issue>8</issue>
      <fpage>101</fpage>
      <lpage>107</lpage>
      <permissions>
        <copyright-year>2017</copyright-year>
      </permissions>
      <abstract>
        <p>Image based measurement setups are widely used for multidirectional reflectance measurements of materials. Different reflection models are used to estimate the material reflectance. In this paper we use two commonly known simple reflection models to evaluate an image based measurement
 setup proposed in our previous studies. Sample material is measured at multiple incident and viewing directions using the setup. The captured data is divided into training and test set to evaluate the setup. Two reflection models are trained using the training dataset. To evaluate the measurement
 setup, one of the sample materials is measured at few incident and viewing directions using a light source and a Tele-Spectro-Radiometer (TSR). This measured data is then compared with the reflectance estimated by the two reflection models. Results shows that image based multi-directional
 reflectance measurements can be performed using measurement setup proposed in our previous work. The data captured using the setup can be used to fit different reflections models for the sample materials used in this setup.</p>
      </abstract>
      <kwd-group>
        <kwd>MULTI-ANGLE REFLECTION MEASUREMENT</kwd>
        <kwd>REFLECTION MODEL</kwd>
        <kwd>IMAGE BASED MEASUREMENTS</kwd>
        <kwd>BRDF</kwd>
      </kwd-group>
    </article-meta>
  </front>
</article>
