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<article article-type="research-article">
  <front>
    <journal-meta>
      <journal-id journal-id-type="aggregator">72010410</journal-id>
      <journal-title>NIP &amp; Digital Fabrication Conference</journal-title>
      <abbrev-journal-title>nip digi fabric conf</abbrev-journal-title>
      <issn pub-type="ppub">2169-4451</issn><issn pub-type="epub"/>
      <publisher>
        <publisher-name>Society of Imaging Science and Technology</publisher-name>
        <publisher-loc>7003 Kilworth Lane, Springfield, VA 22151, USA</publisher-loc>
      </publisher>
    </journal-meta>
    <article-meta><article-id pub-id-type="doi">10.2352/ISSN.2169-4451.2004.20.1.art00005_2</article-id>
      <article-id pub-id-type="sici">2169-4451(20040101)2004:2L.534;1-</article-id>
      <article-id pub-id-type="publisher-id">nip_v2004n2/splitsection5.xml</article-id>
      <article-id pub-id-type="other">/ist/nipdf/2004/00002004/00000002/art00005</article-id>
      <article-categories>
        <subj-group>
          <subject>Articles</subject>
        </subj-group>
      </article-categories>
      <title-group>
        <article-title>Influence of Molecular Orientation on Electrical Conductivity in Copper Phthalocyanine Thin Films</article-title>
      </title-group>
      <contrib-group>
        <contrib>
          <name>
            <surname>Tsuchiya</surname>
            <given-names>Toshikazu</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Takeuchi</surname>
            <given-names>Manabu</given-names>
          </name>
        </contrib>
      </contrib-group>
      <pub-date>
        <day>01</day>
        <month>01</month>
        <year>2004</year>
      </pub-date>
      <volume>2004</volume>
      <issue>2</issue>
      <fpage>534</fpage>
      <lpage>537</lpage>
      <permissions>
        <copyright-year>2004</copyright-year>
      </permissions>
      <abstract>
        <p>Control the orientation of molecular stacking in copper phthalocyanine (CuPc) thin films were tried by applying an electric field during vacuum deposition. The results of the absorption spectra and X-ray diffraction suggest that the electric field changes the molecular configuration
 in the CuPc thin films. The vertical resistivity of the film grown under the electric field was smaller than that of film grown without electric field.</p>
      </abstract>
    </article-meta>
  </front>
</article>
