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<article article-type="research-article">
  <front>
    <journal-meta>
      <journal-id journal-id-type="aggregator">72010410</journal-id>
      <journal-title>NIP &amp; Digital Fabrication Conference</journal-title>
      <abbrev-journal-title>nip digi fabric conf</abbrev-journal-title>
      <issn pub-type="ppub">2169-4451</issn><issn pub-type="epub"/>
      <publisher>
        <publisher-name>Society of Imaging Science and Technology</publisher-name>
        <publisher-loc>7003 Kilworth Lane, Springfield, VA 22151, USA</publisher-loc>
      </publisher>
    </journal-meta>
    <article-meta><article-id pub-id-type="doi">10.2352/ISSN.2169-4451.2000.16.1.art00018_1</article-id>
      <article-id pub-id-type="sici">2169-4451(20000101)2000:1L.78;1-</article-id>
      <article-id pub-id-type="publisher-id">nip_v2000n1/splitsection18.xml</article-id>
      <article-id pub-id-type="other">/ist/nipdf/2000/00002000/00000001/art00018</article-id>
      <article-categories>
        <subj-group>
          <subject>Articles</subject>
        </subj-group>
      </article-categories>
      <title-group>
        <article-title>Novel Methods for Testing Image Permanence of Digital Output Materials</article-title>
      </title-group>
      <contrib-group>
        <contrib>
          <name>
            <surname>Kopperl</surname>
            <given-names>David F.</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Price</surname>
            <given-names>David L.</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Brayman</surname>
            <given-names>Howard</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Riehl</surname>
            <given-names>John</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Charles</surname>
            <given-names>Brian</given-names>
          </name>
        </contrib>
        <contrib>
          <name>
            <surname>Tonburintrtipye</surname>
            <given-names>Lek</given-names>
          </name>
        </contrib>
      </contrib-group>
      <pub-date>
        <day>01</day>
        <month>01</month>
        <year>2000</year>
      </pub-date>
      <volume>2000</volume>
      <issue>1</issue>
      <fpage>78</fpage>
      <lpage>80</lpage>
      <permissions>
        <copyright-year>2000</copyright-year>
      </permissions>
      <abstract>
        <p>We present a novel method for testing the light stability of digital output materials The benefits are reduced cycle time, less impact of reciprocity failure and lower original and maintenance costs are the benefits of testing the light-stability of digital output materials with a sulfur-bulb
 based light fading unit. The output is very low in ultraviolet and infrared radiation and can be run at the same intensities as xenon-arc weatherometers. If the goal of the experiment is to simulate indoor lighting conditions, the sulfur-bulb based unit will closely simulate the effects of
 a very high intensity fluorescent fading unit with less cooling problems and considerably lower costs. Data are given comparing the fading of several digital output systems using high and low intensity fluorescent, xenon arc, and sulfur-bulb based fading units.</p>
      </abstract>
    </article-meta>
  </front>
</article>
