We have developed a particle analyzer system, the model PT1000, which analyzes particulates using helium microwave-induced plasma (He-MIP). The PT1000 can measure data for components, composition and size of individual particles for several thousand particles at a time. We applied this system to toner powder analysis and successfully analyzed the coated additive concentration and the degree of dispersion of coated and embedded additives. We detected differences in samples that could not be identified with other analytical techniques.